Auto SE Spectroscopic Ellipsometer for Simple Thin Film Measurement

उत्पाद वर्णन

Product Description :-

Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack  including film thicknesses, optical constants, surface roughness, and film inhomogeneities.

The Auto SE is a highly featured instrument that includes an automatic XYZ stage, real-time imaging of the measurement site and automatic selection of spot size. Many accessories are available to suit a large range of applications.

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